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Industrial Affiliates Symposium 2021

CREOL 2021 • April 15th - 16th

Speaker:
James N. Hilfiker

J.A. Woollam Company

Thin Film Characterization with Spectroscopic Ellipsometry

Friday, April 16th at 11:00 am

Zoom Link

Spectroscopic Ellipsometry is used to characterize the thickness and optical properties of thin films.  It is perfect for films ranging in thickness from sub-nanometer to several microns.  We will describe the technique and review measurements of dielectric, semiconductor, organic, and metal thin films.  The applications of spectroscopic ellipsometry include optical coatings, flat panel displays, organic electronics, photovoltaics, microelectronics, data storage, biosensors, and much more.

CREOL, The College of Optics and Photonics

University of Central Florida
4304 Scorpius St.
P.O. Box 162700
Orlando, FL 32816-2700
(407)823-6800
creol@ucf.edu