The Nanophotonics and Near-field Optics Group manages a variable angle mapping spectroscopic ellipsometer, the Woollam M2000. The system enables the rapid determination of linear optical properties (refractive index, absorption coefficient, depolarization factors, anisotropy) in the UV-VIS-NIR spectral range. Focusing optics enable a measurement spot size as small as 100×100 um2. Samples up to 6×6″ can be investigated, and a motorized sample stage enables automated multi-point measurements (sample mapping). Incident angles between 45-65 degrees off-normal can be used. Contact Prof. Kik for information about system access. Please check in advance if samples adhere to the measurement guidelines.

System specifications:
– determination of film thickness, refractive index, anisotropy
– wavelength range of 0.24um – 1.7um
– spectral resolution ~3 nm (UV-VIS) to ~6nm (NIR)
– full spectral measurements in under 5 seconds (single spot)
– automated variable angle between 45-65 degrees off-normal
– automated sample mapping, maximum area 6″ x 6″
– spatial mapping resolution (spot size) better than 100×100 um2